OSE Special Seminar by Dr. Michael Trubetskov on Optical Multilayer Coatings for Ultrafast Lasers

Departmental News

Dr. Michael Trubetskov

Posted: November 7, 2017

Where: P&A, Room 190

When: November 10, 2017 1:00PM - 2:00PM 

Abstract: Within the last two decades, dispersive dielectric multilayer mirrors have played a significant role in the progress of ultrafast science. Continuous progress in the design, manufacturing, and characterization of multilayer structures is strongly dependent on powerful numerical methods. The analysis of multilayer coatings is based on matrix algorithm, which can be derived directly from Maxwell equations. The computations of group delay and group delay dispersion have specific features and complications, requiring special precautions in describing material dispersion. The design problem is usually formulated in a variational form, and due to existence of multiple extrema this non-convex problem is very complicated. Modern design methods based on needle optimization and gradual evolution approaches will be considered and demonstrated during the presentation. Several mirrors for different wavelength regions, bandwidths, GDD levels will be shown. At the concluding part, I am going to discuss non-linear effects in multilayers significantly affecting their properties at high intensities. One example will be a UV mirror where two-photon absorption plays significant role, another example will be a special filter with sharp transition zone utilizing Kerr nonlinearity.

Dr. Michael Trubetskov received his Ph.D. and Dr. of Sc. Degrees from Lomonosov Moscow State University, where he worked from 1985 until 2012. Since April 2012, M.Trubetskov is with Max Planck Institute of Quantum Optics in Garching, Germany. He works in the group of Prof. F. Krausz and his main research directions are connected with all aspects of multilayer coatings and their applications. He is also CEO of OptiLayer GmbH developing OptiLayer Thin Film software for the analysis and synthesis of multilayers, for pre- and post-production characterization of thin films and multilayer coatings.